Published in MICRO, 2024
IEEE MICRO Top Picks Honourable Mention
Peter W. Deutsch*, Vincent Q. Ulitzsch*, Sudhanva Gurumurthi, Vilas Sridharan, Joel S. Emer and Mengjia Yan. 2024. DelayAVF: Calculating Architectural Vulnerability Factors for Delay Faults. In the Proceedings of the 57th IEEE/ACM International Symposium on Microarchitecture (MICRO '24) https://people.csail.mit.edu/mengjia/data/2024.MICRO.DelayAVF.pdf
Published in ISCA, 2023
Peter W. Deutsch, Weon Taek Na, Thomas Bourgeat, Joel S. Emer, and Mengjia Yan. 2023. Metior: A Comprehensive Model to Evaluate Obfuscating Side-Channel Defense Schemes. In the Proceedings of the 50th Annual International Symposium on Computer Architecture (ISCA '23) https://people.csail.mit.edu/mengjia/data/2023.ISCA.Metior.pdf
Published in ASPLOS, 2022
Peter W. Deutsch*, Yuheng Yang*, Thomas Bourgeat, Jules Drean, Joel S. Emer, and Mengjia Yan. 2022. DAGguise: Mitigating Memory Timing Side Channels. In the Proceedings of the 27th ACM International Conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS ’22) https://people.csail.mit.edu/mengjia/data/2022.ASPLOS.DAGguise.pdf
Published in Journal of Cryptographic Engineering, 2019
Willers, O., Huth, C., Guajardo, J., Seidel, H. and Deutsch, P. 2019. On the feasibility of deriving cryptographic keys from MEMS sensors. Journal of Cryptographic Engineering. 10, 1 (2019), 67–83. https://link.springer.com/article/10.1007/s13389-019-00208-4